THEORETICAL FRAMEWORK FOR A PROTOTYPE MEASUREMENT AND VERIFICATION (M&V) METER THAT SUPPORTS BASIC M&V 2.0 PRINCIPLES

Authors

  • Marius Bekker, Jan Harm Christiaan Pretorius Author

DOI:

https://doi.org/10.46121/pspc.54.3.25

Keywords:

Advanced measurement and verification, M&V meter, Quality control path

Abstract

A theoretical framework is presented for a prototype Measurement and Verification (M&V) meter. The development of the framework was guided by the regulations, standards, and operating procedures applied in South Africa. The possibility of its further development for other M&V markets, or for more advanced M&V methods than presented here, is not excluded. Longstanding fundamental considerations associated with the classical approach toward M&V, such as process transparency and data integrity, are provided for in the framework as are newer considerations associated with the more recent approaches of M&V 2.0, such as data granularity and real time reporting. The equipment of the industry standard data acquisition path is combined in a single node, and the extent of the quality control path is reduced to one piece of equipment. The framework is supported by the development of Simulink models that provide some basic functionality. Simulation results show that the models perform their intended functions. The models will be interconnected appropriately during prototyping in order to function as the sub-models of a larger model, and additional sub-models will be developed for more complex functions. An introductory overview of the existing and future models is presented. Details will be presented at a more advanced stage of development.

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Published

2026-07-18